NSF EUV ERC

NSF Engineering Research Center
for Extreme Ultraviolet (EUV) Science and Technology

Thrust 2: Imaging, Patterning, and Metrology

In this thrust we are exploiting the short wavelength and high coherent attributes of the EUV laser output to implement testbeds for EUV imaging, patterning and metrology. Present activities involve EUV and soft x-ray microscopy, EUV interferometry, EUV print exposures and EUV holographic lithography.

Critical to the use of compact EUV sources in these application testbeds is the development of EUV optical components. Available to the ERC are unique nanofabrication facilities at Lawrence Berkeley Laboratory Center for X-Ray Optics and high quality EUV mirror coating facilities at several of the core institutions.

These efforts provide evidence of the great potential of EUV light in support of nanotechnology.

 

 

 

Recent Results

Projects

  1. High Resolution Soft X-Ray Microscopy with Synchrotron Radiation.
  2. High Resolution Microscopy with Tabletop EUV Lasers.

    a. <30 nm spatial resolution with EUV lasers.

    b. < 100 nm spatial resolution with 46.9 nm capillary discharge laser illumination.

    c. Smallest EUV microscope uses desktop size EUV laser illumination.

  3. Lenseless imaging using High Harmonic EUV Light Sources: (picture below)
  4. Lambda = 13 nm interferometry Test Bed for the Metrology of EUV Lithography Optics.
  5. Laser Interferometry of Very Dense Plasmas.
  6. Nanopatterning with Compact EUV Lasers.
  7. Demonstration of Nanometer-scale Ablation with a Focused EUV Laser Beam: Development of a LIBS Nanoprobe in Collaboration with Corporate Partner JMAR.

Publications

For more information see: Lawrence Berkeley National Laboratory and Carmen Menoni's Homepage

This work is supported primarily by the Engineering Research Centers Program of the National Science Foundation under NSF Award Number EEC-0310717. Any opinions, findings and conclusions or recommendations expressed in this material are those of the author(s) and do not reflect those of the National Science Foundation.
Last updated: 8/5/2006